Tuesday 21/03/2023, 12:00

FORTH Seminar Room 1

Dr. Andrey Orekhov
University of Antwerp (UA), NANOlab, Antwerpen, Belgium
e-mail: [email protected]


Transmission electron microscopy (TEM) is a powerful technique that has become an essential tool
for investigating materials at the atomic and molecular level. In recent years, there have been
significant advancements in TEM methods, which have enabled researchers to obtain more detailed
information about a wide range of materials. One of the most important developments in TEM is the
introduction of aberration-corrected lenses, which have greatly improved the resolution of images
and allowed for the observation of single atoms. Another significant development is the use of in-situ
techniques, which allow for the real-time observation of dynamic processes at the nanoscale. Other
methods such as electron tomography, electron diffraction, and energy-loss spectroscopy have also
been developed, which provide complementary information about the structure, composition, and
properties of materials. In this talk I will give an overview of these advanced methods in TEM which
have revolutionized our understanding of materials and have opened up new avenues for materials
science research.