Invited Speaker: Nicolas.Gauquelin,University of Antwerp (UA), NANOlab, Antwerpen, Belgium
Tuesday 10/10/2023, 11:00-13:00
Location:FORTH Seminar Room 1
Abstract:
In this seminar, I will talk about advanced electron microscopy characterization of 2D materials. I
will start by making an introduction to TEM and STEM as well as 2D. In a second part I will review
what has been done on graphene with imaging (determination of the number of layers, moiré patterns,
defects and impurities. I will finish by introducing 4D-STEM and recent developments in our about
mapping the orientations of graphene with the SEM.[1] I will then introduce spectroscopies (EDX
and EELS) and their use in graphene characterization.[2] The lecture with continue focus on
Transition metal dichalcogenides (TMD) focusing on MoS2 and WS2 and the determination of the
stacking [3-4]. I will then talk about exfoliated perovskites and their use [5]. To finish I will report
some recent work on Black Phosphorus (BP) [6] and the more exotic charge density wave (CDW)
materials rare-earth chalchogenides.[7].
[1] A. Orekhov et al., https://doi.org/10.48550/arXiv.2011.01875
[2] S.Stambula et al,.J Phys. Chem. C , 118, 8, 3890–3900 (2014)
[3] S. Psilodimitrakopoulos et al. npj2D Materials and Applications, 5, 77 (2021)
[4] A. Nalin Mehta et al., Nanotechnology 31 (44), 445702 (2020)
[5] T.P.P. Le, et al., Adv. Funct. Materials 30 (1), 1900028 (2020)
[6] H.C. Nerl et al., Adv. Funct. Mater. 29 (37), 1903120 (2019)
[7] A. Achari et al., Nano Letters 22 (15), 6268-6275 (2022)
